The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2023
Filed:
Dec. 22, 2020
Nec Corporation, Tokyo, JP;
Hayato Itsumi, Tokyo, JP;
Florian Beye, Tokyo, JP;
Yusuke Shinohara, Tokyo, JP;
Takanori Iwai, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
The image analysis apparatus includes: a first analysis unit that analyzes image frames by using a first image analysis model; a second analysis unit that can analyze the image frames by using a second image analysis model an analysis accuracy of which is lower; a storage unit that stores therein analyzed frames, which are already analyzed by using the first and second image analysis models, in association with an evaluation value for evaluating a result of an analysis performed with the second image analysis model; an extraction unit that extracts an analyzed frame that satisfies an extraction condition based on the evaluation value; and an update unit that updates the second image analysis model by using a result of an analysis performed with the first image analysis model on the extracted analyzed frame, and a result of an analysis performed with the first image analysis model on a new frame.