The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2023
Filed:
Apr. 27, 2020
The Boeing Company, Chicago, IL (US);
Robert Michael Lawton, Huntsville, AL (US);
Craig S. Bosma, Madison, AL (US);
Lindsay Leigh Waite Jones, Madison, AL (US);
The Boeing Company, Arlington, VA (US);
Abstract
Systems and methods for assessing plotting device accuracy in aid of a process for qualifying plotter systems. The system and process involve an ideal (virtual) test pattern consisting of digital data defining a nominal grid augmented by geometric features (e.g., closed two-dimensional geometric shapes which respectively surround intersections or vertices of the nominal grid). The plotting device under test is commanded to print a test plot having a pattern that matches the test pattern, but the test plot may deviate from the test pattern. To measure the amount of deviation, first an image of the test plot on the printed medium is captured using an accurate optical scanner. Then a mathematical measurement process, implemented in a computer vision application (e.g., a software package), is employed to detect deviations of the test plot from the test pattern. A statistical analysis is then performed to determine whether the deviations are within specifications.