The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

Jul. 24, 2020
Applicant:

Apple Inc., Cupertino, CA (US);

Inventor:

Jason de Villiers, Cambridge, GB;

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/33 (2017.01); G06N 20/00 (2019.01); G06T 5/50 (2006.01); G06V 10/46 (2022.01);
U.S. Cl.
CPC ...
G06T 7/33 (2017.01); G06N 20/00 (2019.01); G06T 5/50 (2013.01); G06V 10/462 (2022.01); G06T 2207/10036 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/20221 (2013.01);
Abstract

Devices, methods, and program storage devices for training and leveraging machine learning (ML) models to use in image registration, especially on unaligned multispectral images, are disclosed, comprising: obtaining aligned multispectral image data; generating a first plurality of feature descriptors for features identified in the aligned multispectral image data; generating a training set of feature descriptor pairs based on the first plurality of feature descriptors; and training a ML model based on the training set of feature descriptor pairs, wherein the trained ML model is configured to determine matches between features in unaligned multispectral image data. The techniques may then: obtain unaligned multispectral image data; generate a second plurality of feature descriptors for features identified in the unaligned multispectral image data; and use the trained ML model to determine matches between features in the second plurality of feature descriptors, which matches may be used in performing image registration and/or fusion operations.


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de Villiers, Jason. (2023). Systems and methods for machine learning enhanced image registration (U.S. Patent No. 11620759). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11620759

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