The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

May. 19, 2020
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Tomas Karnagel, Zurich, CH;

Onur Kocberber, Baden-Daettwil, CH;

Farhan Tauheed, Zurich, CH;

Nipun Agarwal, Saratoga, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

Techniques for estimating the number of distinct values in a data set using machine learning are provided. In one technique, a sample of a data set is retrieved where the sample is a strict subset of the data set. The sample is analyzed to identify feature values of multiple features of the sample. The feature values are inserted into a machine-learned model that computes a prediction regarding a number of distinct values in the data set. An estimated number of distinct values that is based on the prediction is stored in association with the data set.


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