The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

Mar. 22, 2021
Applicant:

Ping an Technology (Shenzhen) Co., Ltd., Shenzhen, CN;

Inventors:

Ke Yan, Bethesda, MD (US);

Jinzheng Cai, Bethesda, MD (US);

Youbao Tang, Bethesda, MD (US);

Dakai Jin, Bethesda, MD (US);

Shun Miao, Bethesda, MD (US);

Le Lu, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/214 (2023.01); G06T 7/70 (2017.01); G06N 3/08 (2023.01); G06T 7/00 (2017.01); G06V 30/262 (2022.01); G06F 18/213 (2023.01);
U.S. Cl.
CPC ...
G06F 18/2155 (2023.01); G06F 18/213 (2023.01); G06N 3/08 (2013.01); G06T 7/0014 (2013.01); G06T 7/70 (2017.01); G06V 30/274 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30004 (2013.01);
Abstract

The present disclosure provides a method, a device, and a computer program product using a self-supervised anatomical embedding (SAM) method. The method includes randomly selecting a plurality of images; for each image of the plurality of images, performing random data augmentation to obtain a patch pair, generating global and local embedding tensors for each patch of the patch pair, and selecting positive pixel pairs from the patch pair and obtaining positive embedding pairs; for each positive pixel pair, computing global and local similarity maps, finding global hard negative embeddings, selecting global random negative embeddings, pooling the global hard negative embeddings and the global random negative embeddings to obtain final global negative embeddings, and finding local hard negative embeddings using the global and local similarity maps, and randomly sampling final local negative embeddings from the local hard negative embeddings; and minimizing a final info noise contrastive estimation (InfoNCE) loss.


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