The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

Sep. 28, 2018
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Ricky Gene Burnett, Davis, CA (US);

Dipock Das, San Carlos, CA (US);

Steven Shaun McIntyre, Queen Creek, AZ (US);

Darrell Sano, Oakland, CA (US);

Assignee:

SPLUNK Inc., San Francisco, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/248 (2019.01); G06N 20/00 (2019.01); G06F 16/28 (2019.01); G06F 16/2458 (2019.01);
U.S. Cl.
CPC ...
G06F 16/248 (2019.01); G06F 16/2477 (2019.01); G06F 16/287 (2019.01); G06N 20/00 (2019.01);
Abstract

Machine data is collected from multiple sources of an operating environment such as an information technology system, factory floor, or the like, into a data intake and query system, in one embodiment. Metrics representative of the environment are included in or derived from the data. Users may interact with an interface to depict a representation of various metrics and interdependencies and that depiction is reflected in a computer storage model. Changes to the computer storage model based on the user interaction may also result in training of a machine learning model according to the user interaction, the machine learning model configured to determine a prediction, classification or clustering of a result of a first search query by utilizing a result of at least a second search query as input to the machine learning model.


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