The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

Oct. 10, 2019
Applicant:

Datometry, Inc., San Francisco, CA (US);

Inventors:

Florian Michael Waas, San Francisco, CA (US);

Dmitri Korablev, San Francisco, CA (US);

Michele Gage, San Francisco, CA (US);

Mark Morcos, Oakland, CA (US);

Amirhossein Aleyasen, Urbana, IL (US);

Assignee:

DATOMETRY, INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/24 (2019.01); G06F 16/2453 (2019.01); G06F 16/21 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24549 (2019.01); G06F 16/214 (2019.01);
Abstract

Some embodiments provide a method for quantifying the workload placed on a database by an application. The method identifies a first group of database queries that the application directed towards the database. The method produces a second group of queries by removing, from the first group of queries, queries that are duplicates based on the semantic structure of the queries. Based on a set of properties of the second group of queries, the method computes a complexity indicator that represents a complexity expression of the second group of queries.


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