The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

Apr. 13, 2021
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Makoto Murai, Tokyo, JP;

Shin Moriga, Tokyo, JP;

Atsushi Suyama, Edogawa-ku, JP;

Motoaki Hayashi, Shibuya-ku, JP;

Takuya Kudo, Kirkland, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/024 (2013.01); G05B 23/0232 (2013.01); G05B 23/0237 (2013.01);
Abstract

The present disclosure describes a method of controlling a manufacturing system using multivariate time series, the method comprising: recording data from one or more devices in the manufacturing system; storing the recorded data in a data storage as a plurality of time series, wherein each time series has a first recorded value corresponding to a first time and a final recorded value corresponding to an end of the time series; interpolating, within a first time window, missing values in the plurality of time series using a Bayesian model, wherein the missing values fall between the first and end time of the respective time series; storing the interpolated values as prediction data in a prediction storage, wherein the interpolated values include the uncertainty of each interpolated value; loading the recorded data that fall within a second time window from the data storage; loading prediction data from the prediction storage that fall within the second time window and for which no recorded data are available; optimizing the parameters of the Bayesian model using the loaded recorded data and the prediction data; predicting, using the Bayesian model, values for each of the time series for which loaded recorded and prediction data are not available; storing the predicted values as prediction data in the prediction storage, wherein the prediction values include the uncertainty of each prediction value; and adjusting one or more of the devices that generate the recorded data based on the prediction data within the second time window.


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