The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2023
Filed:
Feb. 19, 2021
Infineon Technologies Ag, Neubiberg, DE;
Infineon Technologies AG, Neubiberg, DE;
Abstract
An integrated circuit with self-test circuit is provided. The integrated circuit includes at least one logic circuit, at least one input storage element for storing work data, at least one output storage element, an input test storage element for storing test data, and at least one output test storage element, wherein the logic circuit is selectively connected to the input storage element on the input side, such that the input storage element provides the work data to the logic circuit, or is connected to the input test storage element on the input side, such that the input test storage element provides the test data to the logic circuit, wherein the logic circuit is further connected to the output storage element and the output test storage element on the output side, such that the logic circuit feeds data to the output storage element and/or to the output test storage element, and wherein the output storage element is configured to process the data from the logic circuit if the work data are provided to the logic circuit, and not to process the data from the logic circuit if the test data are provided to the logic circuit.