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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11619640 B1

PDFFull Text
Date of Patent:
Apr. 04, 2023

Filed:

Mar. 28, 2019

Method for generating an index for quality control, apparatus for generating a quality control index, quality control data generation system, and method for constructing a quality control data generation system

Applicant:

Sysmex Corporation, Kobe, JP;

Inventors:

Mamoru Ashida, Kobe, JP;

Motonari Daito, Kobe, JP;

Fumiko Kino, Kobe, JP;

Michiko Yoshimoto, Kobe, JP;

Akane Seki, Kobe, JP;

Kazuhiro Nakashima, Kobe, JP;

Hideki Hirano, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe, JP;

Attorney:

Buchanan, Ingersoll & Rooney PC

Primary Examiner:

Benjamin R Schmitt

Int. Cl.
CPC ...
G01N 35/00 (2006.01); G06F 16/22 (2019.01); G06F 16/215 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G01N 35/00623 (2013.01); G01N 35/00594 (2013.01); G01N 35/00613 (2013.01); G06F 16/215 (2019.01); G06F 16/22 (2019.01); G06F 16/2365 (2019.01); G01N 2035/00653 (2013.01); G01N 2035/00673 (2013.01);
Abstract

The method for generating an index for managing the analytical accuracy of a sample analyzer includes a step of acquiring a determination result related to whether a sample is positive or negative from a plurality of sample analyzers, and a step of generating an index based on a ratio of a sample determined to be positive or negative by the plurality of sample analyzers from a plurality of determination results obtained from the plurality of sample analyzers.

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Ashida, Mamoru. (2023). Method for generating an index for quality control, apparatus for generating a quality control index, quality control data generation system, and method for constructing a quality control data generation system (U.S. Patent No. 11619640). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11619640

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