The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2023
Filed:
Mar. 28, 2019
Applicant:
Sysmex Corporation, Kobe, JP;
Inventors:
Mamoru Ashida, Kobe, JP;
Motonari Daito, Kobe, JP;
Fumiko Kino, Kobe, JP;
Michiko Yoshimoto, Kobe, JP;
Akane Seki, Kobe, JP;
Kazuhiro Nakashima, Kobe, JP;
Hideki Hirano, Kobe, JP;
Assignee:
SYSMEX CORPORATION, Kobe, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G06F 16/22 (2019.01); G06F 16/215 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G01N 35/00623 (2013.01); G01N 35/00594 (2013.01); G01N 35/00613 (2013.01); G06F 16/215 (2019.01); G06F 16/22 (2019.01); G06F 16/2365 (2019.01); G01N 2035/00653 (2013.01); G01N 2035/00673 (2013.01);
Abstract
The method for generating an index for managing the analytical accuracy of a sample analyzer includes a step of acquiring a determination result related to whether a sample is positive or negative from a plurality of sample analyzers, and a step of generating an index based on a ratio of a sample determined to be positive or negative by the plurality of sample analyzers from a plurality of determination results obtained from the plurality of sample analyzers.