The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

Dec. 09, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Mohammed Abdi, San Jose, CA (US);

Aminat Adebiyi, San Jose, CA (US);

Alberto Mannari, San Jose, CA (US);

Andrea Fasoli, San Jose, CA (US);

Ronald Robert Labby, San Jose, CA (US);

Luisa Bozano, Los Gatos, CA (US);

Pawan Chowdhary, San Jose, CA (US);

Abubeker Abdullahi, Central, SC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G06K 9/00 (2022.01); G06K 9/62 (2022.01); G16Y 20/10 (2020.01); G16Y 40/35 (2020.01); G16Y 40/10 (2020.01); G06N 20/20 (2019.01);
U.S. Cl.
CPC ...
G01N 33/0031 (2013.01); G06K 9/00523 (2013.01); G06K 9/623 (2013.01); G06N 20/20 (2019.01); G16Y 20/10 (2020.01); G16Y 40/10 (2020.01); G16Y 40/35 (2020.01);
Abstract

Provided is a system and method for tuning an array of sensors to enable selection of the most suitable sensors for a target application. After extracting features from sensor raw data, the extracted features are ranked with gradient boosting decision trees to assign an importance value to each extracted feature. A threshold value for the entire set of extracted features is calculated and an importance score is calculated for the individual sensors of the array. Individual sensors with an importance score on or above the threshold value are selected for the target application.


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