The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2023
Filed:
Sep. 09, 2019
Applicant:
Hitachi High-tech Science Corporation, Tokyo, JP;
Inventors:
Assignee:
HITACHI HIGH-TECH SCIENCE CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/88 (2006.01); G01N 30/30 (2006.01); G01N 30/32 (2006.01); G01N 30/60 (2006.01); G01N 30/86 (2006.01);
U.S. Cl.
CPC ...
G01N 30/88 (2013.01); G01N 30/30 (2013.01); G01N 30/32 (2013.01); G01N 30/6034 (2013.01); G01N 30/8637 (2013.01); G01N 2030/328 (2013.01); G01N 2030/8804 (2013.01); G01N 2030/889 (2013.01);
Abstract
To make it easy to address the case in which a chromatograph does not appropriately operate. A chromatograph (liquid chromatograph) for analyzing a sample by supplying an eluent and the sample and separating a component contained in the sample to detect the component, the chromatograph including: a detection portion (controller) configured to detect a fault in the analysis; and an operation controller (controller) configured to cause a constituent element related to the analysis to perform at least one of an operation for identifying a factor of the fault and an operation for avoiding the fault.