The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

Jul. 22, 2020
Applicants:

Tsinghua University, Beijing, CN;

Nuctech Company Limited, Beijing, CN;

Inventors:

Zhi Zeng, Beijing, CN;

Xingyu Pan, Beijing, CN;

Xuewu Wang, Beijing, CN;

Junli Li, Beijing, CN;

Ming Zeng, Beijing, CN;

Jianmin Li, Beijing, CN;

Ziran Zhao, Beijing, CN;

Jianping Cheng, Beijing, CN;

Hao Ma, Beijing, CN;

Hui Zhang, Beijing, CN;

Hao Yu, Beijing, CN;

Bicheng Liu, Beijing, CN;

Assignees:

Tsinghua University, Beijing, CN;

Nuctech Company Limited, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/201 (2018.01); G01N 23/02 (2006.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G01N 23/201 (2013.01); G01N 23/02 (2013.01); G06K 9/6226 (2013.01); G06K 9/6277 (2013.01); G01N 2223/052 (2013.01); G01N 2223/054 (2013.01); G01N 2223/304 (2013.01); G01N 2223/501 (2013.01);
Abstract

The present disclosure provides a substance identification device and a substance identification method. The substance identification device comprises: a classifier establishing unit configured to establish a classifier based on scattering density values reconstructed for a plurality of known sample materials, wherein the classifier comprises a plurality of feature regions corresponding to a plurality of characteristic parameters for the plurality of known sample materials, respectively; and an identification unit for a material to be tested, configured to match the characteristic parameter of the material to be tested with the classifier, and to identify a type of the material to be tested by obtaining a feature region corresponding to the characteristic parameter of the material to be tested.


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