The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

May. 14, 2020
Applicant:

The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);

Inventors:

Joseph R. Landry, Rochester, NY (US);

Olav Solgaard, Stanford, CA (US);

Stephen S. Hamann, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G02B 21/36 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G02B 21/0032 (2013.01); G02B 21/0088 (2013.01); G02B 21/365 (2013.01);
Abstract

An axially swept light sheet fluorescence microscope has illumination optics capable scanning the focus region of a line beam along an illumination optical axis to illuminate a light sheet in a sample plane, and detection optics capable of collecting fluorescence light from the sample plane and imaging the collected light on a light detector with a rolling shutter. A microcontroller synchronizes the rolling shutter with the scanning of the focus region. The illumination optics performs the axial scanning using a linear phased array of independently controllable electrostatically driven optical elements controlled by the microcontroller.


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