The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

Jul. 07, 2021
Applicant:

Gamma Scientific Inc., San Diego, CA (US);

Inventors:

Eric John Nelson, San Marcos, CA (US);

Victor Fedoriouk, El Cajon, CA (US);

Assignee:

GAMMA SCIENTIFIC INC., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01);
U.S. Cl.
CPC ...
G01N 21/55 (2013.01); G01N 2021/551 (2013.01);
Abstract

A retroreflectometer for non-contact measurements of optical characteristics of retroreflective materials from a range of distances includes a light source for emitting a light beam; a first moving mirror assembly for scanning the light beam; a collimating lens for collimating the scanning light on an illumination spot on the surface of the DUT; an imaging lens for receiving a reflected scanning light comprised of the collimated scanning light reflected from the surface of the DUT; a second moving mirror assembly for controlling a predetermined observation angle, wherein the first moving mirror assembly and the second moving mirror assembly moved in synchronization to maintain concentricity of the illumination spot on the surface of the DUT; a light collector for collecting the reflected light from the second moving mirror assembly; a processor including a memory for determining the optical characteristics of the surface of the DUT responsive to the collected reflected light.


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