The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2023
Filed:
Dec. 01, 2017
Electrolux Appliances Aktiebolag, Stockholm, SE;
Christian Ehninger, Rothenberg ob der Tauber, DE;
Richard Wiesinger, Rothenberg ob der Tauber, DE;
Marco Böckler, Rothenberg ob der Tauber, DE;
Electrolux Appliances Aktiebolag, Stockholm, SE;
Abstract
The present invention relates to a method for manufacturing a domestic appliance at least comprising the following steps:—at least one positioning and/or prefixing step comprising positioning and/or prefixing of at least a first component part () of the domestic appliance relative to at least a second component part () of the domestic appliance, the first component part () comprising a first contour (), and the second component () part comprising a matching second contour (), respectively, the positioning and/or prefixing comprising positioning and/or prefixing the second contour () in a pre-defined arrangement at the first contour ();—at least one welding step comprising welding together the first and second component parts () along at least one of the first and second contour (); wherein the welding being controlled by a control device and carried out by:—detecting, in particular via a detection device, at least one of a location and course of at least a section of a marking representative for only one of the first and second contour; and—generating a welded seam to join the first and second component along the first and second contour based on the detected location and/or course of the marking.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile