The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Dec. 04, 2020
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Deepak Kumar Poddar, Bangalore, IN;

Soyeb Nagori, Bangalore, IN;

Hrushikesh Tukaram Garud, Maharashtra, IN;

Kumar Desappan, Bangalore, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/77 (2022.01); G06T 3/40 (2006.01); G06V 10/48 (2022.01); G06V 10/46 (2022.01); G06N 3/08 (2006.01); G06N 3/084 (2023.01);
U.S. Cl.
CPC ...
G06V 10/7715 (2022.01); G06T 3/4046 (2013.01); G06V 10/462 (2022.01); G06V 10/48 (2022.01); G06N 3/084 (2013.01);
Abstract

This description relates to image feature extraction. In some examples, a system can include a keypoint detector and a feature list generator. The keypoint detector can be configured to upsample a keypoint score map to produce an upsampled keypoint score map. The keypoint score map can include feature scores indicative of a likelihood of at least one feature being present at keypoints in an image. The feature list generator can be configured to identify a subset of keypoints of the keypoints in the image using the feature scores of the up sampled keypoint score map, determine descriptors for the subset of keypoints based on a feature description map, and generate a keypoint descriptor map for the image based on the determined descriptors.


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