The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Sep. 10, 2020
Applicant:

Scandit Ag, Zurich, CH;

Inventors:

Christian Floerkemeier, Zurich, CH;

Maiya Shur, Zurich, CH;

Bernd Schoner, New York, NY (US);

Assignee:

SCANDIT AG, Zurich, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G03B 37/02 (2021.01); G06V 10/75 (2022.01); G06T 11/00 (2006.01); G06V 10/42 (2022.01); G06V 30/24 (2022.01);
U.S. Cl.
CPC ...
G06V 10/751 (2022.01); G06T 11/00 (2013.01); G06V 10/42 (2022.01); G06V 30/248 (2022.01);
Abstract

A method of image analysis is provided for recognition of a pattern in an image. The method includes receiving a plurality of images acquired by a camera, where the plurality of images include a plurality of optical patterns in an arrangement. The method also includes matching the arrangement to a pattern template, wherein the pattern template is a predefined arrangement of optical patterns. The method also includes identifying an optical pattern of the plurality of optical patterns as a selected optical pattern based on a position of the selected optical pattern in the arrangement. The method also includes decoding the selected optical pattern to generate an object identifier and storing the object identifier in a memory device.


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