The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Apr. 29, 2021
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Tsai-Ling Kao, Tainan, TW;

Kai-Shiang Gan, Tainan, TW;

Hian-Kun Tenn, Tainan, TW;

Wei-Shiang Huang, Tainan, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/75 (2022.01); G06V 10/60 (2022.01); G06T 7/521 (2017.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06V 10/60 (2022.01); G06T 5/009 (2013.01); G06T 5/50 (2013.01); G06T 7/521 (2017.01); G06V 10/751 (2022.01);
Abstract

An image obtaining method comprises: by a projecting device, separately projecting an image acquisition light and a reference light onto a target object, wherein the light intensity of the image acquisition light is higher than the light intensity of the reference light; by an image obtaining device, obtaining a first image and a second image, both the first image and the second image comprising the image of the target object, with the target object of the first image being illuminated by the image acquisition light, and the target object of the second image being illuminated by the reference light, wherein the first image has a first area including a part of the target object, and the second image has a second area including the part of the target object; and by a computing device, performing a difference evaluation procedure to obtain a required light intensity based on a required amount.


Find Patent Forward Citations

Loading…