The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Jul. 03, 2022
Applicant:

Zhejiang Gongshang University, Zhejiang, CN;

Inventors:

Huiyan Wang, Hangzhou, CN;

Huan Jiang, Hangzhou, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06V 10/74 (2022.01); G06V 10/77 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); G06V 10/761 (2022.01); G06V 10/7715 (2022.01); G06T 2207/20076 (2013.01); G06T 2207/20081 (2013.01); G06V 2201/07 (2022.01);
Abstract

The present disclosure provides a method for recognizing a small target based on a deep learning network. The method comprises: determining, based on a collected image, spot defect information through a recognition model including a first feature determination layer, a second feature determination layer, and a spot defect determination layer, determining, based on the collected image, a first feature map, determining, based on the first feature map, a second feature map by fusing with positional encoding, determining, based on the second feature map, a third feature map through the second feature determination layer, and obtaining, based on the third feature map, positional information of the spot defect through a first determination layer, and determining, based on the third feature map, classification information of the spot defect through a second determination layer.


Find Patent Forward Citations

Loading…