The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2023
Filed:
Apr. 15, 2020
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Amihai Savir, Sansana, IL;
Arthur Wensing, Nieuw-Vennep, NL;
Noga Gershon, Dimona, IL;
Marcel Bernard Körner, Chorvatsky Grob, SK;
Ivan Mlynek, D. Jurkovica, SK;
Jorge Luis Perez, Coral Gables, FL (US);
Michael Rupert James Thatcher, Streatley, GB;
Dhev George Kollannur, Austin, TX (US);
Omer Sagi, Mazkaret Batya, IL;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Artificial intelligence (AI)-based techniques are provided that predict a quality score for a product-related data structure associated with one or more products. One method comprises obtaining data for a given product-related data structure; evaluating a plurality of first features related to a customer account associated with the given product-related data structure using the obtained data; evaluating a plurality of second features related to the given product-related data structure using the obtained data; processing at least some of the first features and the second features using at least one model that provides a predicted quality score for the given product-related data structure; and applying one or more thresholds to the predicted quality score to determine an acceptance status related to the given product-related data structure. A weighting of the first features and the second features can be learned during a training phase.