The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Oct. 26, 2018
Applicant:

Nippon Telegraph and Telephone Corporation, Chiyoda-ku, JP;

Inventors:

Yasuhiro Ikeda, Musashino, JP;

Keisuke Ishibashi, Musashino, JP;

Yusuke Nakano, Musashino, JP;

Keishiro Watanabe, Musashino, JP;

Ryoichi Kawahara, Musashino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06K 9/62 (2022.01); G06N 7/00 (2023.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06K 9/6215 (2013.01); G06K 9/6256 (2013.01); G06N 7/005 (2013.01); G06V 10/82 (2022.01);
Abstract

An anomaly detection apparatus having a function of an autoencoder that includes an input layer, hidden layers, and an output layer, and that learns parameters such that data of the input layer is reproduced in the output layer, the anomaly detection apparatus including: input means that input normal data of a plurality of types; learning means that learn parameters such that normal data of the input layer is reproduced in the output layer by learning a feature across data types using data of a dimension which is smaller than a dimension of the normal data; and anomaly degree calculation means that input test data to the autoencoder using the parameters learned by the learning means, and calculate anomaly degree of the test data based on output data of the autoencoder and the test data.


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