The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

May. 11, 2020
Applicant:

Beijing Baidu Netcom Science and Technology Co., Ltd., Beijing, CN;

Inventor:

Yong Wang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2023.01); G06N 3/063 (2023.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06N 3/063 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01);
Abstract

Embodiments of the present disclosure provide a method and an apparatus for testing a depth learning chip, an electronic device, and a computer-readable storage medium. The method includes: testing a plurality of logic units in the depth learning chip. The plurality of logic units are configured to perform at least one of an inference operation and a training operation for depth learning. The method further include: obtaining one or more error units that do not pass the testing from the plurality of logic units. In addition, the method further includes: in response to a ratio of a number of the one or more error units to a total number of the plurality of logic units being lower than or equal to a predetermined ratio, determining the depth learning chip as a qualified chip.


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