The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Mar. 17, 2021
Applicant:

The Heil Co., Chattanooga, TN (US);

Inventors:

Prem Swaroop, Arlington, MA (US);

Atish P. Kamble, Arlington, MA (US);

Bodhayan Dev, Marlborough, MA (US);

Assignee:

The Heil Co., Chattanooga, TN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06V 10/56 (2022.01); G06V 10/20 (2022.01); G06V 20/56 (2022.01);
U.S. Cl.
CPC ...
G06K 9/6262 (2013.01); G06K 9/6257 (2013.01); G06V 10/255 (2022.01); G06V 10/56 (2022.01); G06V 20/56 (2022.01);
Abstract

Among other things, the techniques described herein include a method for receiving a plurality of images of one or more containers while the one or more containers are being emptied, the plurality of images comprising a training set of images and a validation set of images; labeling each image of the plurality of images as including either an overfilled container or a not-overfilled container; processing each image of the plurality of images to reduce bias of a machine learning model; training, and based on the labeling, the machine learning model using the plurality of images; and optimizing the machine learning model by performing learning against the validation set, the optimized machine learning model being used to generate a prediction for a new image of a container, the prediction indicating whether the container in the new image was overfilled prior to the new container being emptied.


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