The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Dec. 01, 2020
Applicants:

Huawei Technologies Co., Ltd., Shenzhen, CN;

The Hong Kong Polytechnic University, Hong Kong, CN;

Inventors:

Qingqing Ye, Hong Kong, CN;

Haibo Hu, Hong Kong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/2458 (2019.01); G06F 16/22 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2458 (2019.01); G06F 16/2228 (2019.01); G06F 16/2365 (2019.01);
Abstract

A method and an apparatus for sending key-value pair data are provided, and a method and an apparatus for collecting key-value pair data are provided. In the method, first target key-value pair data is perturbed as first perturbed key-value pair data, so that a data collector can determine, based on a value a or b of a first value in the first perturbed key-value pair data, whether to include the entire first perturbed key-value pair data into the statistical result in a process of generating the statistical result. In this way, an association between a value and a key in the key-value pair data is reserved in the first perturbed key-value pair data, which improves availability of the first perturbed key-value pair data. That is, a statistical result generated by the data collector based on the first perturbed key-value pair data is closer to a statistical result generated based on original user key-value pair data.


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