The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Dec. 03, 2020
Applicant:

Sumo Logic, Inc., Redwood City, CA (US);

Inventors:

Christian Friedrich Beedgen, San Carlos, CA (US);

David M. Andrzejewski, San Francisco, CA (US);

Benjamin Everette Newton, Belmont, CA (US);

Kumar Avijit, Fremont, CA (US);

Stefan Christoph Zier, San Jose, CA (US);

Assignee:

Sumo Logic, Inc., Redwood City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/00 (2019.01); G06F 16/23 (2019.01); G06F 16/22 (2019.01); G06F 16/24 (2019.01); G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2379 (2019.01); G06F 16/2228 (2019.01); G06F 16/24 (2019.01); G06F 16/258 (2019.01);
Abstract

Logs to metrics synthesis includes receiving a log message. It further includes translating the log message into a metrics data point comprising a timestamp, a metric name, a metric value, and a set of metadata key-value pairs. It further includes determining a time series in which to insert the metrics data point into which the log message was translated. It further includes inserting the metrics data point into the determined time series. It further includes updating a metadata catalog based at least in part on the metrics data point.


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