The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Nov. 04, 2019
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Hitesh Bhagchandani, Bangalore, IN;

Rajarajan Thangavel Ramalingam, Bangalore, IN;

Basavaraj Chidanandappa, Koppal, IN;

Sriharsha Sravan Karavadi, Hyderabad, IN;

Manish Kumar, Navi Mumbai, IN;

Amartya Ray, Mumbai, IN;

Zakir Hussain, Kurnool, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 30/23 (2020.01);
U.S. Cl.
CPC ...
G06F 11/008 (2013.01); G06F 30/23 (2020.01);
Abstract

A material failure forecasting system accesses historical failure data to forecasts future failures. The failure data of a material is analyzed using text processing techniques to identify failures and suspensions. The text processing techniques provide for identifying failures when fault words are associated with negations. A fault ontology establishes different failure modes that include primary, secondary and tertiary levels which enable identifying a sequence of failures. The failures thus identified are fitted to a data distribution selected from a plurality of data distributions. The parameters from the data distribution are used for simulating a demand profile for the material which considers interchangeability. Similarly failure data of the materials in an equipment can be analyzed and the reliability of the equipment can be estimated.


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