The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Apr. 20, 2021
Applicants:

Tsinghua University, Beijing, CN;

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventors:

Ben-Qi Zhang, Beijing, CN;

Jun Zhu, Beijing, CN;

Yi-Lin Tan, Beijing, CN;

Guo-Fan Jin, Beijing, CN;

Shou-Shan Fan, Beijing, CN;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/18 (2006.01); G02B 27/00 (2006.01); G01J 3/18 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0012 (2013.01); G01J 3/18 (2013.01); G01J 3/2823 (2013.01); G02B 5/1861 (2013.01);
Abstract

A method for designing a freeform concave grating imaging spectrometer includes selecting a series of light rays incident from different positions of a slit as characteristic light rays. The coordinates and normal directions of characteristic data points at intersections of the characteristic light rays and a surface of a freeform concave grating are calculated. A freeform surface shape of the freeform concave grating is obtained by fitting, so that an initial structure is obtained. Then the initial structure is optimized.


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