X-ray detector with focused scintillator structure for uniform imaging

Abstract

Dual layer detector (XD) for X-ray imaging, comprising at least two light sensitive surfaces (LSS,LSS). The dual layer detector further comprises a first scintillator layer (SL, SL) including at least one scintillator element (SE) capable of converting X-radiation into light, the element having two faces, an ingress face (S) for admitting X-radiation into the element (SE) and an egress face (S) distal from the ingress face (S), wherein the two faces (S,S) are arranged shifted relative to each other, so that a longitudinal axis (LAX) of the scintillator element (SE) is inclined relative to a normal (n) of the layer. The scintillator element (SE) has a sidewall (w,w) extending between the two faces (S,S), the scintillator layer (SL) further comprising a second such scintillator element (SE') having a sidewall (w′,w′), the second scintillator element (SE′) neighboring the first scintillator element (SE), wherein the sidewall (w,w) of the first scintillator element (SE) and the sidewall (w′,w′) of the second scintillator element (SE) are neighbored and are inclined relative to each other. The dual layer detector (XD) further comprises a second such scintillator layer (SL). One of the light sensitive surfaces (LSS,LSS) is arranged in between the two scintillator layers (SL, SL).