The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2023
Filed:
Mar. 11, 2022
Applicant:
Trustees of Boston University, Boston, MA (US);
Inventors:
Joshua Javor, Cambridge, MA (US);
David Bishop, Brookline, MA (US);
David Campbell, Brookline, MA (US);
Matthias Imboden, St. Blaise, CH;
Assignee:
Trustees of Boston University, Boston, MA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/022 (2006.01); G01R 33/038 (2006.01); G01R 33/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/022 (2013.01); G01R 33/0052 (2013.01); G01R 33/038 (2013.01); G01R 33/0385 (2013.01);
Abstract
A gradiometer includes a at least one magnet attached to a beam. The magnet moves in response to a magnetic force. A sensing element is configured to measure movement or deflection of the beam or magnet. The gradiometer is configured to determine a gradient of a magnetic field acting on the first magnet based on movement of the magnet. The gradiometer can further measure higher order gradients.