The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2023
Filed:
Feb. 27, 2020
Topcon Corporation, Itabashi-ku, JP;
Riken, Wako-Shi, JP;
Shigenori Nagano, Itabashi-ku, JP;
Satoru Ishiguro, Itabashi-ku, JP;
Yoshie Otake, Wako-Shi, JP;
Hideyuki Sunaga, Wako-Shi, JP;
Yuichi Yoshimura, Wako-Shi, JP;
Koji Ikado, Wako-Shi, JP;
Topcon Corporation, Tokyo, JP;
RIKEN, Wako, JP;
Abstract
A non-destructive inspection system includes: a neutron emission unitcapable of emitting neutrons pulsed; a neutron detector capable of detecting the neutrons emitted from the neutron emission unit and penetrating through an inspection object; a storage unit storing attenuation information indicating a relationship between a material of the inspection object and attenuation of the neutrons; and a calculation unit capable of calculating distance information indicating a position of a specific portion in the inspection object in accordance with time change information which is information on a change over time in an amount of the neutrons detected by the neutron detector. The calculation unit is capable of generating information related to an amount of the specific portion from information based on the amount of the neutrons according to the time change information, using the distance information and the attenuation information.