The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2023
Filed:
Jan. 03, 2020
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Nuctech (Beijing) Company Limited, Beijing, CN;
Jianmin Li, Beijing, CN;
Li Zhang, Beijing, CN;
Yuanjing Li, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Hao Yu, Beijing, CN;
Shangmin Sun, Beijing, CN;
Bicheng Liu, Beijing, CN;
Weizhen Wang, Beijing, CN;
Dongyu Wang, Beijing, CN;
Yuan Ma, Beijing, CN;
Yu Hu, Beijing, CN;
Chunguang Zong, Beijing, CN;
Other;
Abstract
The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.