The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Jun. 07, 2021
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Shigeru Ichihara, Tokyo, JP;

Yuki Yonetani, Kanagawa, JP;

Makoto Kawaguchi, Kanagawa, JP;

Yasuhisa Shigehara, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/17 (2006.01); G01N 21/65 (2006.01); G01N 21/03 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 21/17 (2013.01); G01N 21/03 (2013.01); G01N 21/65 (2013.01); G01N 21/84 (2013.01); G01N 2021/0389 (2013.01); G01N 2021/1765 (2013.01); G01N 2021/845 (2013.01);
Abstract

An identification apparatus includes a window unit including a passage surface on an upper side configured to allow a sample supplied from a conveyance unit to slide along and pass on the passage surface, a light irradiation unit disposed below the window unit, spaced a certain distance from the passage surface, and configured to irradiate the sample with a primary light through the window unit, a light collection unit disposed below the window unit and configured to collect a secondary light from the sample through the window unit, and an acquisition unit configured to acquire identification information for identifying a property of the sample based on the secondary light collected by the light collection unit.


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