The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Oct. 13, 2020
Applicant:

Fredrick S. Solheim, Boulder, CO (US);

Inventor:

Fredrick S. Solheim, Boulder, CO (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/52 (2022.01); G01J 5/53 (2022.01); G01J 5/00 (2022.01); G06N 3/02 (2006.01); G06F 18/214 (2023.01); G01J 5/80 (2022.01);
U.S. Cl.
CPC ...
G01J 5/53 (2022.01); G01J 5/0003 (2013.01); G06F 18/214 (2023.01); G06N 3/02 (2013.01); G01J 5/802 (2022.01); G01J 5/804 (2022.01); G01J 2005/0074 (2013.01); G01J 2005/0077 (2013.01);
Abstract

Apparatus and methods are disclosed utilizing selected infrared waveband observations to determine selected profiles of interest. A correlative system is constructed and installed at a processor. Thermal and refractivity profiles and structure in a waveband of interest are extracted from observed infrared spectrum single waveband observations received for processing at the processor by the correlative system. The output provides the selected profiles of interest in the waveband of interest. The apparatus includes an infrared receiver and means for measuring angular displacement of received emissions relative to a horizon. The processor converts received emission into equivalent Planck blackbody temperatures across the observations and correlates structure and vertical distribution of the temperatures to provide thermodynamic and refractivity profiles of interest.


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Solheim, Fredrick. (2023). Characterizing tropospheric boundary layer thermodynamic and refractivity profiles utilizing selected waveband infrared observations (U.S. Patent No. 11614367). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11614367

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