The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Jul. 27, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Dongkyun Kim, Suwon-si, KR;

Hyuck Choo, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2022.01); G01J 5/08 (2022.01); G01J 5/06 (2022.01); G01J 5/00 (2022.01);
U.S. Cl.
CPC ...
G01J 5/024 (2013.01); G01J 5/0255 (2013.01); G01J 5/06 (2013.01); G01J 5/0853 (2013.01); G01J 2005/0077 (2013.01);
Abstract

A long-wave infrared detecting element includes a magnetic field generator configured to generate a magnetic field; a substrate on the magnetic field generator; a superparamagnetic material layer disposed to be separated from the substrate and magnetized by the magnetic field generated by the magnetic field generator; a support unit on the substrate to support the superparamagnetic material layer such that the superparamagnetic material layer separated from the substrate, such that the support unit and the superparamagnetic material layer generate heat by absorbing infrared radiation from the outside; and a magneto-electric conversion unit that generates an electrical signal proportional to both a strength of the magnetic field generated by the magnetic field generator and the magnetization of the superparamagnetic material layer.


Find Patent Forward Citations

Kim, Dongkyun. (2023). Long-wave infrared detecting element, long-wave infrared detecting element array structure, long-wave infrared temperature detecting device, and thermal imaging device (U.S. Patent No. 11614364). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11614364

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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