The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Dec. 23, 2021
Applicant:

Optiz, Inc., Palo Alto, CA (US);

Inventors:

Rob Heeman, Veldhoven, NL;

Edwin Wolterink, Valkenswaard, NL;

Assignee:

Optiz, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/04 (2006.01); G01J 3/28 (2006.01); G01J 3/02 (2006.01); G01J 3/18 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/0208 (2013.01); G01J 3/04 (2013.01); G01J 2003/1861 (2013.01);
Abstract

A camera includes a first lens configured to focus incoming light onto a reflective slit assembly. The reflective slit assembly comprises an elongated strip of reflective material configured to reflect some but not all of the incoming light as return light. The first lens is configured to at least partially collimate the return light from the elongated strip of reflective material. A first mirror is configured to reflect the return light from the first lens. A second mirror is configured to reflect the return light from the first mirror. An optical element is configured to separate the return light from the first mirror as a function of wavelength. A second lens is configured to focus the return light from the optical element onto a first detector. The first detector is configured to measure intensities of the return light as a function of two dimensional position on the first detector.


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