The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Jun. 19, 2020
Applicants:

Tyrata, Inc., Durham, NC (US);

Duke University, Durham, NC (US);

Inventors:

Steven Cummer, Chapel Hill, NC (US);

Joseph Batton Andrews, Durham, NC (US);

Aaron Daniel Franklin, Cary, NC (US);

David Alan Koester, Burlington, NC (US);

James Barton Summers, III, Raleigh, NC (US);

Assignees:

Tyrata, Inc., Durham, NC (US);

Duke University, Durham, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/06 (2006.01); B60R 16/023 (2006.01); B60C 25/00 (2006.01); B60C 19/00 (2006.01); B60C 25/05 (2006.01);
U.S. Cl.
CPC ...
G01B 7/087 (2013.01); B60C 19/00 (2013.01); B60C 25/007 (2013.01); B60R 16/023 (2013.01); B60C 25/0551 (2013.01); B60C 2019/004 (2013.01);
Abstract

Methods of measuring a thickness of a material are disclosed. An oscillating signal at a measurement frequency is applied to a circuit including an inductive component and a capacitive component provided using a pair of capacitive sensor electrodes adjacent the material. The measurement frequency is less than a resonant frequency of the circuit, and the resonant frequency is based on the inductive component and the capacitive component. Information regarding a value of a measured parameter is generated based on applying the oscillating signal at the measurement frequency to the circuit. A value of the measured parameter is related to the thickness of the material.


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