The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

Apr. 06, 2021
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Muhammad Nazmul Islam, Littleton, MA (US);

Valentin Alexandru Gheorghiu, Yokohama, JP;

Awlok Singh Josan, San Francisco, CA (US);

Junyi Li, Franklin Park, NJ (US);

Changhwan Park, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 72/08 (2009.01); H04L 5/00 (2006.01); H04W 72/10 (2009.01); H04W 72/044 (2023.01);
U.S. Cl.
CPC ...
H04W 72/085 (2013.01); H04L 5/0032 (2013.01); H04W 72/044 (2013.01); H04W 72/10 (2013.01);
Abstract

Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a user equipment (UE) may determine a scaling factor for a beam failure detection (BFD) evaluation period associated with a secondary cell group of a set of secondary cell groups. The scaling factor may be determined based at least in part on a number of secondary cell groups included in the set of secondary cell groups. In some aspects, the UE may perform a BFD measurement, associated with the secondary cell group, based at least in part on the scaling factor for the BFD evaluation period. Numerous other aspects are provided.


Find Patent Forward Citations

Loading…