The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

May. 25, 2021
Applicant:

Fraunhofer-gesellschaft Zur Förderung Der Angewandten Forschung E.v., Munich, DE;

Inventors:

Frank Wippermann, Jena, DE;

Jacques Duparré, Jena, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/271 (2018.01); H04N 13/207 (2018.01); H04N 13/254 (2018.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
H04N 13/271 (2018.05); H04N 5/2254 (2013.01); H04N 13/207 (2018.05); H04N 13/254 (2018.05);
Abstract

A multi-aperture imaging device is provided that includes an image sensor and an array of adjacently arranged optical channels. Each optical channel includes an optic for imaging at least one partial field of view of a total field of view onto an image sensor area of the image sensor. The device has a beam-deflector for deflecting an optical path of the optical channels and the beam-deflector includes a first beam-deflecting area operative for a first wavelength range of electromagnetic radiation passing through the optical channel; and a includes second beam-deflecting area operative for a second wavelength range of the electromagnetic radiation passing through the optical channels. The second wavelength range is different from the first wavelength range.


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