The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2023
Filed:
May. 24, 2021
Applicant:
Fujifilm Business Innovation Corp., Tokyo, JP;
Inventor:
Yosuke Tashiro, Kanagawa, JP;
Assignee:
FUJIFILM Business Innovation Corp., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/10 (2017.01); H04N 1/409 (2006.01); G06T 7/00 (2017.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/4092 (2013.01); G06T 7/0004 (2013.01); H04N 1/00411 (2013.01); H04N 1/00811 (2013.01); G06T 2207/30144 (2013.01); G06T 2207/30168 (2013.01);
Abstract
An inspection device includes a processor configured to use original image data as correct image data, and in a case where a first inspection of determining quality of read image data as an inspection target is performed using the correct image data, the read image data being obtained by reading an image-formed matter obtained by forming the original image data on a recording medium, perform a second inspection on a contour portion included in the read image data as the inspection target, the second inspection using read image data obtained based on the original image data, as the correct image data.