The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

Jun. 11, 2021
Applicant:

Pharmacadence Analytical Services, Llc, Hatfield, PA (US);

Inventors:

Richard C. King, III, Quakertown, PA (US);

William J. Metzler, IV, Doylestown, PA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G01N 27/623 (2021.01); H01J 49/02 (2006.01); H01J 49/16 (2006.01); H01J 49/30 (2006.01); G01R 19/00 (2006.01); H01J 49/10 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0009 (2013.01); G01N 27/623 (2021.01); H01J 49/027 (2013.01); H01J 49/165 (2013.01); H01J 49/168 (2013.01); H01J 49/30 (2013.01); G01R 19/0061 (2013.01); H01J 49/10 (2013.01);
Abstract

The present invention comprises novel methods of continuously monitoring the performance of an atmospheric pressure ionization (API) system. The methods of the invention allow for improved quality monitoring of the processes that leads to the formation of ions at atmospheric pressure. The methods of the invention further allow for continuously monitoring for the quality of the ion formation process in API without the addition of extraneous material (such as labelled compounds or control known compounds) to the system being monitored.


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