The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

May. 09, 2020
Applicant:

Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;

Inventors:

Xin Xiao, Shanghai, CN;

Tao He, Shanghai, CN;

Xi Zhang, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01); A61B 6/08 (2006.01); H01J 35/02 (2006.01); H01J 35/06 (2006.01); H01J 35/08 (2006.01); H01J 35/10 (2006.01); H01J 35/14 (2006.01); H01J 35/24 (2006.01); H01J 35/26 (2006.01); H01J 35/30 (2006.01); G06T 11/00 (2006.01); G21K 1/087 (2006.01); G21K 1/093 (2006.01);
U.S. Cl.
CPC ...
H01J 35/153 (2019.05); A61B 6/032 (2013.01); A61B 6/08 (2013.01); A61B 6/40 (2013.01); A61B 6/4021 (2013.01); A61B 6/52 (2013.01); A61B 6/5205 (2013.01); A61B 6/54 (2013.01); A61B 6/542 (2013.01); A61B 6/545 (2013.01); A61B 6/56 (2013.01); A61B 6/563 (2013.01); A61B 6/566 (2013.01); A61B 6/58 (2013.01); A61B 6/582 (2013.01); G06T 11/005 (2013.01); G21K 1/087 (2013.01); G21K 1/093 (2013.01); H01J 35/02 (2013.01); H01J 35/06 (2013.01); H01J 35/08 (2013.01); H01J 35/10 (2013.01); H01J 35/14 (2013.01); H01J 35/147 (2019.05); H01J 35/24 (2013.01); H01J 35/26 (2013.01); H01J 35/30 (2013.01); H01J 35/305 (2013.01);
Abstract

Systems and methods for determining an offset of a position of a focal point of an X-ray tube is provided. The methods may include obtaining at least one parameter associated with an X-ray tube during a scan of a subject. The methods may further include determining a target offset of a position of a focal point based on the at least one parameter and a target relationship between a plurality of reference parameters associated with the X-ray tube and a plurality of reference offsets of reference positions of the focal point. The methods may further include causing, based on the target offset, a correction on the position of the focal point of the X-ray tube.


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