The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

Nov. 08, 2017
Applicant:

Giesecke+devrient Currency Technology Gmbh, Munich, DE;

Inventors:

Holger Trumpfheller, Munich, DE;

Steffen Schmalz, Munich, DE;

Norbert Holl, Germering, DE;

Wolfgang Röhrl, Riemerling, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07D 7/12 (2016.01); G07D 11/50 (2019.01); B65H 31/24 (2006.01); B65H 43/00 (2006.01); G07D 7/026 (2016.01); G07D 7/04 (2016.01); G07D 7/06 (2006.01);
U.S. Cl.
CPC ...
G07D 7/12 (2013.01); B65H 31/24 (2013.01); B65H 43/00 (2013.01); G07D 7/026 (2013.01); G07D 7/04 (2013.01); G07D 7/06 (2013.01); G07D 11/50 (2019.01); G07D 2207/00 (2013.01); G07D 2211/00 (2013.01);
Abstract

An apparatus and method for classifying value documents includes least two sensor devices arranged to capture waves reflected on a front side and on a back side of a value document and to generate corresponding sensor data or to capture properties of the value document in at least two different regions of the value document by means of different measuring principles and to generate corresponding sensor data. At least one evaluation device is arranged to classify the value document with the aid of the sensor data generated by the at least two sensor devices, which sensor data relate to the waves reflected on the front side and back side of the value document or to the properties of the value document captured in the at least two different regions of the value document by means of different measuring principles.


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