The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

Mar. 15, 2021
Applicant:

Beijing Baidu Netcom Science and Technology Co., Ltd., Beijing, CN;

Inventors:

Jian Wang, Beijing, CN;

Zipeng Lu, Beijing, CN;

Hao Sun, Beijing, CN;

Hongwu Zhang, Beijing, CN;

Shilei Wen, Beijing, CN;

Errui Ding, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06V 10/46 (2022.01); G06N 3/04 (2023.01); G06F 18/213 (2023.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); G06V 40/20 (2022.01);
U.S. Cl.
CPC ...
G06V 10/462 (2022.01); G06F 18/213 (2023.01); G06N 3/04 (2013.01); G06T 7/73 (2017.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); G06T 2207/20084 (2013.01); G06T 2207/30196 (2013.01); G06V 40/20 (2022.01);
Abstract

A method and apparatus for positioning a key point, a device, and a storage medium are provided. The method may include: extracting a first feature map and a second feature map of a to-be-positioned image, the first feature map and the second feature map being different feature maps; determining, based on the first feature map, an initial position of a key point in the to-be-positioned image; determining, based on the second feature map, an offset of the key point; and adding the initial position of the key point with the offset of the key point to obtain a final position of the key point.


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