The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

Sep. 09, 2021
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Hirosada Horiguchi, Minowa, JP;

Shuji Narimatsu, Hokuto, JP;

Hiroshi Hasegawa, Chino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/521 (2017.01); G06T 7/60 (2017.01); G06T 7/62 (2017.01); G06T 7/586 (2017.01); G01B 11/25 (2006.01); G01B 11/06 (2006.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G01B 11/0608 (2013.01); G01B 11/254 (2013.01); G06K 9/6215 (2013.01); G06T 7/586 (2017.01); G06T 7/60 (2013.01); G06T 2207/10024 (2013.01);
Abstract

A three-dimensional shape measuring method includes: projecting a first grid pattern based on a first light and a second grid pattern based on a second light onto a target object in such a way that the first grid pattern and the second grid pattern intersect each other, the first light and the second light being lights of two colors included in three primary colors of light; picking up, by a three-color camera, an image of the first grid pattern and the second grid pattern projected on the target object, and acquiring a first picked-up image based on the first light and a second picked-up image based on the second light; and performing a phase analysis of a grid image with respect to at least one of the first picked-up image and the second picked-up image and calculating height information of the target object.


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