The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

May. 28, 2019
Applicant:

Ati Technologies Ulc, Markham, CA;

Inventors:

Tung Chuen Kwong, Richmond Hill, CA;

Benjamin Koon Pan Chan, Markham, CA;

David Porpino Sobreira Marques, Kleinburg, CA;

Clarence Ip, Unionville, CA;

Hung Wilson Yu, Markham, CA;

Assignee:

ATI Technologies ULC, Markham, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06F 17/18 (2006.01); G06K 9/62 (2022.01); G06V 20/10 (2022.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06F 17/18 (2013.01); G06K 9/6267 (2013.01); G06V 20/10 (2022.01);
Abstract

Systems, apparatuses, and methods for implementing a safety monitor framework for a safety-critical inference application are disclosed. A system includes a safety-critical inference application, a safety monitor, and an inference accelerator engine. The safety monitor receives an input image, test data, and a neural network specification from the safety-critical inference application. The safety monitor generates a modified image by adding additional objects outside of the input image. The safety monitor provides the modified image and neural network specification to the inference accelerator engine which processes the modified image and provides outputs to the safety monitor. The safety monitor determines the likelihood of erroneous processing of the original input image by comparing the outputs for the additional objects with a known good result. The safety monitor complements the overall fault coverage of the inference accelerator engine and covers faults only observable at the network level.


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