The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

Feb. 28, 2019
Applicant:

Adobe Inc., San Jose, CA (US);

Inventors:

Deepak Pai, Santa Clara, CA (US);

Debraj Debashish Basu, Los Angeles, CA (US);

Joshua Alan Sweetkind-Singer, San Jose, CA (US);

Assignee:

ADOBE INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06N 20/00 (2019.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6276 (2013.01); G06F 11/3086 (2013.01); G06N 20/00 (2019.01);
Abstract

In some examples, a prototype model that includes a representative subset of data points (e.g., inputs and output classifications) of a machine learning model is analyzed to efficiently interpret the machine learning model's behavior. Performance metrics such as a critic fraction, local explanation scores, and global explanation scores are determined. A local explanation score capture an importance of a feature of a test point to the machine learning model determining a particular class for the test point and is computed by comparing a value of a feature of a test point to values for prototypes of the prototype model. Using a similar approach, global explanation scores may be computed for features by combining local explanation scores for data points. A critic fraction may be computed to quantify a misclassification rate of the prototype model, indicating the interpretability of the model.


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