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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11610083 B1

PDFFull Text
Date of Patent:
Mar. 21, 2023

Filed:

Jul. 05, 2018

Method for calculating clustering evaluation value, and method for determining number of clusters

Applicant:

Tohoku University, Miyagi, JP;

Inventors:

Tetsuo Endoh, Miyagi, JP;

Hui Shen, Miyagi, JP;

Assignee:

TOHOKU UNIVERSITY, Miyagi, JP;

Attorneys:

Fox Rothschild LLP

Robert J. Sacco

Carol E. Thorstad-Forsyth

Primary Examiner:

Mohammed Rachedine

Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06N 20/00 (2019.01); G06F 16/906 (2019.01);
U.S. Cl.
CPC ...
G06K 9/6262 (2013.01); G06K 9/622 (2013.01); G06K 9/6272 (2013.01); G06N 20/00 (2019.01);
Abstract

Provided is a method for calculating an evaluation score of clustering quality, based on the number of clusters into which a plurality of data is clustered. The calculating the evaluation score includes: calculating a degree of internal compactness that is a sum of values, each being defined by normalizing a first index value by a first value that is based on a number of data within each cluster, the first index value indicating a degree of dispersion of data within each cluster; calculating a degree of external separation defined by normalizing a sum of a second index value for each cluster by a second value that is based on the number of clusters, the second index value indicating an index of a distance between the clusters; and calculating the evaluation score according to a predetermined formula having, as variables, the degree of internal compactness and the degree of external separation.

Find Patent Forward Citations

Endoh, Tetsuo. (2023). Method for calculating clustering evaluation value, and method for determining number of clusters (U.S. Patent No. 11610083). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11610083

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