The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

Aug. 07, 2019
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Jimmy Iskandar, Fremont, CA (US);

James Robert Moyne, Canton, MI (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G05B 23/02 (2006.01); G06F 11/34 (2006.01); G06F 11/30 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06K 9/6227 (2013.01); G05B 23/0294 (2013.01); G06F 11/3075 (2013.01); G06F 11/3495 (2013.01); G06K 9/6228 (2013.01); G06K 9/6256 (2013.01); G06N 20/00 (2019.01);
Abstract

A method includes receiving, from sensors, current trace data including current sensor values associated with producing products. The method further includes processing the current trace data to identify features of the current trace data and providing the features of the current trace data as input to a trained machine learning model that uses a hyperplane limit for product classification. The method further includes obtaining, from the trained machine learning model, outputs indicative of predictive data associated with the hyperplane limit and processing the predictive data and the hyperplane limit to determine: first products associated with a first product classification and second products associated with a second product classification based exclusively on the subset of the plurality of features; and third products associated with the first product classification or the second product classification based on an additional feature not within the subset.


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