The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

Oct. 16, 2020
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Takuya Oda, Tokyo, JP;

Michiko Tanaka, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/284 (2020.01); G06N 20/00 (2019.01); G06F 40/205 (2020.01); G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G06F 40/284 (2020.01); G06F 18/2155 (2023.01); G06F 40/205 (2020.01); G06N 20/00 (2019.01);
Abstract

A label assignment model generation device extracts a plurality of feature amounts for a word from a document as an extraction source, and generates, based on an appearance frequency of each of the extracted feature amounts, a label assignment model that is a machine learning model and assigns a label to a word included in a document as an assignment target. The label assignment model generation device adjusts a degree of influence of the feature amount on the label assignment model based on a deviation of the appearance frequency of each of the plurality of feature amounts. The label assignment model generation device extracts a plurality of feature amounts for a word from a remaining document excluding a predetermined document from a plurality of documents as extraction sources, and generates the label assignment model based on the appearance frequency of the extracted feature amounts.


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